We quickly develop hardware, firmware, and software for new grid metrology concepts. Our lab is fully set up for NIST-trace Calibration, UL Safety and CE Standards certification, and instrument FCC/CE emissions/immunity testing.
Everything we design is optimized for fast transition to commercial manufacturing, quick global deployment, and integration into sales channels.
We are NOW AVAILABLE for small projects, advisory activities, etc.. If you are interested in working together, please contact us.
We developed the GridSweep ™ Instrument, pictured, with $4M cost-shared funding from the U.S. Department of Energy.
Over the last 40 years, Alex McEachern led the development of:
McEachern has been awarded over 30 patents in power metrology, and has published dozens of peer-reviewed papers. He is a Life Fellow of the IEEE, a Visiting Scholar at U.C. Berkeley, and an Affiliate at Lawrence Berkeley National Lab.
We have led the development of IEC, IEEE, and SEMI Standards on electric power measurements and power quality immunity.
We have close working relationships with universities and experts in over 40 countries.